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Volumn 216, Issue 11, 2002, Pages 1131-1144

The variation of the reflection coefficient of extensional guided waves in pipes from defects as a function of defect depth, axial extent, circumferential extent and frequency

Author keywords

Chemical plant; Guided waves; Low frequency ultrasound; Non destructive testing; Pipes

Indexed keywords

FINITE ELEMENT METHOD; FREQUENCIES; PIPE; REFLECTION; THICKNESS MEASUREMENT;

EID: 0036924739     PISSN: 09544062     EISSN: None     Source Type: Journal    
DOI: 10.1243/095440602761609498     Document Type: Article
Times cited : (75)

References (21)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.