Cohesive zone modeling of interfacial delamination in PZT thin films

International Journal of Solids and Structures

Volumn 46, Issue 13, 2009, Pages 2739-2749

  Yan, Yabin ^a   Shang, Fulin ^a  

^a State Key Laboratory of Strength and Vibration for Mechanical Struictures School of Aerospace   (China)

Author keywords

Cohesive zone model; Delamination; Interface; Thin film

Indexed keywords

COHESIVE STRENGTHS; COHESIVE ZONE MODEL; COHESIVE ZONES; COHESIVE-ZONE MODELING; EXPERIMENTAL INVESTIGATIONS; FILM MATERIALS; FRACTURE BEHAVIORS; FREE EDGES; INTERFACE; INTERFACE FRACTURES; INTERFACIAL DELAMINATIONS; MODEL-BASED; MULTI-LAYERED; NUMERICAL SIMULATIONS; PIEZOELECTRIC THIN FILMS; PZT LAYERS; PZT THIN FILMS; SIMULATION RESULTS; SINGLE-CRYSTAL SILICONS; THEORETICAL INVESTIGATIONS; WORK OF SEPARATIONS;

BRITTLE FRACTURE; CHROMIUM; DELAMINATION; INTERFACIAL ENERGY; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; SEMICONDUCTING LEAD COMPOUNDS; STEEL SHEET; SUBSTRATES; THICKNESS MEASUREMENT; THIN FILM DEVICES; THIN FILMS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 65349134248     PISSN: 00207683     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijsolstr.2009.03.002     Document Type: Article

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