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Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

Validation of the microelectromechanical system flux concentrator concept for minimizing the effect of 1/f noise

(7) Edelstein, A S a Burnette, J E a Fischer, G A a Olver, K a Egelhoff, Wm b Nowak, E c Cheng, Shu Fan d

a U S ARMY RESEARCH LABORATORY (United States)

b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

c UNIVERSITY OF DELAWARE (United States)

d NAVAL RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE; COMB DRIVES; ELECTROSTATIC COMB DRIVES; MICRO-ELECTRO MECHANICAL SYSTEMS; OPERATING FREQUENCIES; OSCILLATORY MOTIONS; POWER SIGNALS; SIGNAL-TO-NOISE RATIOS; VACUUM PACKAGING;

CONCENTRATION (PROCESS); DRIVES; MECHATRONICS; MEMS; MICROELECTROMECHANICAL DEVICES; SIGNAL TO NOISE RATIO; SOLAR CONCENTRATORS;

COMPOSITE MICROMECHANICS;

EID: 65249189442 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3076497 Document Type: Article

Times cited : (30)

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