Thickness dependence of structure and magnetic properties of annealed [Fe/Pt] n multilayer films

Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

  Yao, Bo ^a   Coffey, Kevin R ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED FILMS; DARK-FIELD TRANSMISSION ELECTRON MICROSCOPIES; FEPT PHASE; FILM THICKNESS; GRAIN SIZES; MAGNETOCRYSTALLINE ANISOTROPY ENERGY DENSITIES; NOVEL TECHNIQUES; PHASE FORMATIONS; PHASE FRACTIONS; PHASE GRAINS; POTENTIAL APPLICATIONS; PROCESSING TEMPERATURES; THICKNESS DEPENDENCES;

ANNEALING; FILM PREPARATION; GRAIN SIZE AND SHAPE; MAGNETIC ANISOTROPY; MAGNETIC RECORDING; MAGNETISM; MAGNETS; MULTILAYERS; NUCLEATION; TRANSMISSION ELECTRON MICROSCOPY;

MULTILAYER FILMS;

EID: 65249169235     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3073842     Document Type: Article

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