Effect of aluminum on the local structure of silicon in zeolites as studied by Si K edge X-ray absorption near-edge fine structure: Spectra simulation with a non-muffin tin atomic background

Journal of Physical Chemistry B

Volumn 113, Issue 14, 2009, Pages 4614-4618

  Bugaev, Lusegen A ^a,b   Van Bokhoven, Jeroen A ^a,b,c   Khrapko, Valerii V ^a,b   Avakyan, Leon A ^a,b   Latokha, Jana V ^a,b  

^a SOUTHERN FEDERAL UNIVERSITY   (Russian Federation)

^b ETH ZURICH   (Switzerland)

^c Institute for Chemical and Bioengineering   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ALUMINA; ALUMINUM; ATOMIC SPECTROSCOPY; ATOMS; OXYGEN; SEMICONDUCTING ALUMINUM COMPOUNDS; SILICATE MINERALS; SILICON; SILICON COMPOUNDS; TIN; TITANIUM COMPOUNDS; X RAY ABSORPTION; X RAY ANALYSIS; ZEOLITES;

ALUMINUM ATOMS; ALUMINUM CONTENTS; EXPERIMENTAL SPECTRUM; INTRINSIC LOSS; LOCAL STRUCTURES; MORDENITE; OXYGEN BONDS; SILICON COORDINATIONS; SPECTRA SIMULATIONS; STRUCTURAL DISTORTIONS; WHITE LINES; X-RAY ABSORPTION NEAR-EDGE FINE STRUCTURES; XANES SPECTRUM; ZEOLITE FAUJASITE;

CRYSTAL ATOMIC STRUCTURE;

EID: 65249152021     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp8098285     Document Type: Article

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