Non-MT determination of X-ray absorption cross-section's factorized atomic part in the near-edge region. Application to Si K-edge XANES analysis in beta-zeolites

AIP Conference Proceedings

Volumn 882, Issue , 2007, Pages 117-119

  Bugaev, L A ^a   Van Bokhoven, J A ^b   Avakyan, L A ^a   Latokha, Ya V ^a  

^a SOUTHERN FEDERAL UNIVERSITY   (Russian Federation)

^b ETH ZURICH   (Switzerland)

Author keywords

Factorized atomic part of the absorption cross section; Si K edge XANES; Zeolite beta

Indexed keywords

EID: 33947431035     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2644446     Document Type: Conference Paper

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