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Volumn 113, Issue 2, 2009, Pages 729-735

Viscoelastic properties of polyethylene glycol (PEG) boundary layers near a solid substrate

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION DEPENDENCES; CONCENTRATION OF; CONCENTRATION RANGES; DYNAMIC SHEAR MODULUS; ELECTRODE SURFACES; FLUID LAYERS; PENETRATION DEPTHS; POWER LAWS; QUARTZ CRYSTAL RESONATORS; QUARTZ CRYSTALS; SEMIDILUTE; SOLID SUBSTRATES; SOLUTION INTERFACES; VISCO-ELASTIC PROPERTIES;

EID: 65249138733     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp809129r     Document Type: Article
Times cited : (16)

References (59)
  • 12
    • 0024034223 scopus 로고    scopus 로고
    • Brown, W.; Stepanek, P. Macromolecules 1988, 21, 1791. Brown, W.; Stepanek, P. Macromolecules 1993, 26, 6884.
    • Brown, W.; Stepanek, P. Macromolecules 1988, 21, 1791. Brown, W.; Stepanek, P. Macromolecules 1993, 26, 6884.
  • 23
    • 0036790972 scopus 로고    scopus 로고
    • Lee, K. H.; Kim, H. Y.; La, Y. M.; Lee, D. R.; Sung, N. H. J. Polym. Sci. Part B: Polym. Phys. 2002, 40, 2259.
    • Lee, K. H.; Kim, H. Y.; La, Y. M.; Lee, D. R.; Sung, N. H. J. Polym. Sci. Part B: Polym. Phys. 2002, 40, 2259.
  • 29
    • 0020098504 scopus 로고    scopus 로고
    • Adam, M.; Delsanti, M. J. de Phys. (Paris) 1982, 43, 549. Adam, M.; Delsanti, M. J. de Phys. (Paris) 1983, 44, 1185.
    • Adam, M.; Delsanti, M. J. de Phys. (Paris) 1982, 43, 549. Adam, M.; Delsanti, M. J. de Phys. (Paris) 1983, 44, 1185.
  • 40
    • 84951279351 scopus 로고    scopus 로고
    • Sauerbrey, G. Z. Phys. 1959, 155, 206; Bottom, V. E. Introduction to Quartz Crystal Unit Design ; Van Nostrand Reinhold Co.: New York, 1982.
    • Sauerbrey, G. Z. Phys. 1959, 155, 206; Bottom, V. E. Introduction to Quartz Crystal Unit Design ; Van Nostrand Reinhold Co.: New York, 1982.
  • 49
    • 65249149762 scopus 로고    scopus 로고
    • Geelhood, S. J.; Frank, C. W.; Kanazawa, K. J. Electrochem. Soc. 2002, 149, H33. Muramatsu, H.; Tamiya, E.; Karube, I. Anal. Chem. 1988, 60, 2142.
    • Geelhood, S. J.; Frank, C. W.; Kanazawa, K. J. Electrochem. Soc. 2002, 149, H33. Muramatsu, H.; Tamiya, E.; Karube, I. Anal. Chem. 1988, 60, 2142.
  • 51
    • 65249172678 scopus 로고    scopus 로고
    • Sinopharm Chemical reagent Co. Ltd, SCRC, China
    • Sinopharm Chemical reagent Co. Ltd. (SCRC), Shanghai, China 200002.
    • Shanghai , pp. 200002
  • 53
    • 0141529589 scopus 로고    scopus 로고
    • DeMaggio, G. B. Phys. Rev. Lett. 1997, 78, 1524. Forrest, J. A.; Dalnoki-Veress, K. Adv. Colloid Interface Sci. 2001, 94, 167. Kawana, S.; Jones, R. A. Phys. Rev.E 2001, 63, 021501.
    • DeMaggio, G. B. Phys. Rev. Lett. 1997, 78, 1524. Forrest, J. A.; Dalnoki-Veress, K. Adv. Colloid Interface Sci. 2001, 94, 167. Kawana, S.; Jones, R. A. Phys. Rev.E 2001, 63, 021501.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.