Optical characterization of the nanoscale organization of mineral deposits on silk films

Applied Optics

Volumn 48, Issue 10, 2009, Pages

  Gupta, Sharad ^a   Hunter, Martin ^a   Kaplan, David ^a   Georgakoudi, Irene ^a  

^a Tufts University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOMECHANICS; DEPOSITS; FRACTALS; HISTOLOGY; LAMINATES; LIGHT SCATTERING; MINERAL RESOURCES; MINERALOGY; MINERALS; NANOCRYSTALS; SCANNING ELECTRON MICROSCOPY; SILK;

CORRELATION LENGTHS; ENGINEERED TISSUES; LIGHT SCATTERING SPECTROSCOPY; NANO-SCALE ORGANIZATION; NONINVASIVE CHARACTERIZATIONS; OPTICAL CHARACTERIZATION; SECONDARY STRUCTURES; SELF-AFFINE FRACTALS;

TISSUE;

MINERAL; NANOPARTICLE;

ARTICLE; CHEMISTRY; FRACTAL ANALYSIS; LIGHT; METHODOLOGY; RADIATION SCATTERING; SILK; SPECTROSCOPY;

FRACTALS; LIGHT; MINERALS; NANOPARTICLES; SCATTERING, RADIATION; SILK; SPECTRUM ANALYSIS;

EID: 65249131209     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.000D45     Document Type: Article

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