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Volumn 42, Issue 8, 2009, Pages
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Morphology and magnetoresistance of Co2Cr0.6Fe 0.4Al-based tunnelling junctions
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AL THIN FILMS;
ATOMICALLY FLAT SURFACES;
B2 STRUCTURES;
FERMI ENERGIES;
HALF-METALLIC MATERIALS;
HEUSLER COMPOUNDS;
IN-SITU;
MGO BUFFER LAYERS;
MGO SUBSTRATES;
MGO(1 0 0);
PREPARATION CONDITIONS;
R F SPUTTERING;
RF- MAGNETRON SPUTTERING;
TUNNELLING JUNCTIONS;
UNIT CELLS;
WETTING PROPERTIES;
ALUMINUM;
BUFFER LAYERS;
ELECTRIC RESISTANCE;
MAGNETIC FIELD EFFECTS;
MAGNETORESISTANCE;
MAGNETRON SPUTTERING;
MORPHOLOGY;
PLATINUM;
SPIN DYNAMICS;
TRANSPORT PROPERTIES;
CHROMIUM;
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EID: 65249127454
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/42/8/084006 Document Type: Article |
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Times cited : (12)
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References (12)
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