A study of the interaction between perylene and the TiO2(1 1 0)-(1 × 1) surface-based on XPS, UPS and NEXAFS measurements

Surface Science

Volumn 603, Issue 9, 2009, Pages 1270-1275

  Simonsen, Jens Bæk ^a   Handke, Bartosz ^b   Li, Zheshen ^c   Møller, Preben Juul ^d  

^a UNIVERSITY OF COPENHAGEN   (Denmark)

^b AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^c AARHUS UNIVERSITY   (Denmark)

^d UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

Density functional calculations (DFT); Near edge extended X ray absorption fine structure (NEXAFS); Perylene; Physical vapor deposition; Rutile; TiO2(1 1 0); Ultraviolet photoelectron spectroscopy (UPS); X ray photoelectron spectroscopy (XPS)

Indexed keywords

DENSITY FUNCTIONAL CALCULATIONS (DFT); NEAR-EDGE EXTENDED X-RAY ABSORPTION FINE-STRUCTURE (NEXAFS); PERYLENE; RUTILE; TIO2(1 1 0); ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY (UPS); X-RAY PHOTOELECTRON SPECTROSCOPY (XPS);

ABSORPTION SPECTROSCOPY; AROMATIC HYDROCARBONS; DENSITY FUNCTIONAL THEORY; ELECTRON SPECTROSCOPY; ELECTRON TRANSITIONS; EMISSION SPECTROSCOPY; GAS ABSORPTION; LUMINESCENCE OF ORGANIC SOLIDS; MOLECULAR ORBITALS; OXIDE MINERALS; PHOTOEMISSION; PHOTOIONIZATION; PHOTONS; POWER SUPPLY CIRCUITS; PROBABILITY DENSITY FUNCTION; SINGLE CRYSTAL SURFACES; SPECTRUM ANALYSIS; TITANIUM OXIDES; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; UNINTERRUPTIBLE POWER SYSTEMS; VAN DER WAALS FORCES; VAPORS; X RAY ABSORPTION; X RAYS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 65249111557     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2009.03.016     Document Type: Article

References (43)

1. ÓRegan B., and Grätzel M. Nature 353 (1991) 737
2. Hung L.S., and Chen C.H. Mater. Sci. Eng. Rep. 39 (2002) 143
3. Dimitrakopoulos C.D., and Mascaro D.J. IBM J. Res. Dev. 45 (2001) 11
4. Dimitrakopoulos C.D., and Malenfant P.R.L. Adv. Mater. 14 (2002) 99
5. Clemens W., Fix W., Ficker J., Knobloich A., and Ullmann A. J. Mater. Res. 19 (2004) 1963
6. Sheats J.R. J. Mater. Res. 19 (2004) 1974
7. Baldi M., Finocchio E., Milella F., and Busca G. Appl. Catal. B: Environ. 16 (1998) 43
8. Larsson P.O., and Andersson A.J. Catalysis 179 (1998) 72
9. Kung H.H. Transition Met. Oxides: Surf. Chem. Cat. Stud. Surf. Sci. Catal. 45 (1989) 1
10. Henderson M.A., Otero-Tapia S., and Castro M.E. Faraday Discuss. 114 (1999) 313
11. Jayaweera P.M., Quah E.L., and Idriss H. J. Phys. Chem. C 111 (2007) 1764
12. Zehr R.T., and Henderson M.A. Surf. Sci. 602 (2008) 2238
13. Henderson M.A. Langmuir 21 (2005) 3443
14. Käckell P., and Terakura K. Surf. Sci. 461 (2000) 191
15. Guo Q., Cocks I., and Williams E.M. Surf. Sci. 393 (1997) 1
16. Farfan-Arribas E., and Madix R.J. J. Phys. Chem. B 107 (2003) 3225
17. Suzuki S., Yamaguchi Y., Onishi H., Sasaki T., Fukui K.I., and Iwasawa Y.J. Chem. Soc., Faraday Trans. 94 (1998) 161
18. Diebold U. Surf. Sci. Rep. 48 (2003) 53
19. Köppen S., and Langel W.P. Phys. Chem. Chem. Phys. 10 (2008) 1907
20. Koller G., Berkebile S., Krenn J.R., Tzvetkov G., Hlawacek G., Lengyel O., Netzer F.P., and Ramsey M.G. Adv. Mater. 16 (2004) 2159
21. Reiss S., Krumm H., Niklewski A., Staemmler V., and Wöll Ch. J. Chem. Phys. 116 (2002) 7704
22. Wu C.C., Lin Y.T., Chiang H.H., Cho T.Y., Chen C.W., Wong K.T., Liao Y.L., Lee G.H., and Peng S.M. Appl. Phys. Lett. 81 (2002) 577
23. Ferrere S., and Gregg B.A. New J. Chem. 26 (2002) 1155
24. Rudiono, Kaneko F., and Takeuchi M. Appl. Surf. Sci. 142 (1999) 598
25. Li Z.S., Jorgensen J.H., Moller P.J., Sambi M., and Granozzi G. Appl. Surf. Sci. 142 (1999) 135
26. Sambi M., Della Negra M., Granozzi G., Li Z.S., Jorgensen J.H., and Moller P.J. Appl. Surf. Sci. 142 (1999) 146
27. Krygowski T.M., Ciesielski A., Swirska B., and Leszczynski P. Pol. J. Chem. 68 (1994) 2097
28. Witte G., Hänel K., Söhnchen S., and Wöll C.H. Appl. Phys. A 82 (2006) 447
29. Hänel K., Söhnchen S., Lukas S., Beernink G., Birkner A., Strunskus T., Witte G., and Wöll Ch. J. Mater. Res. 19 (2004) 2049
30. Tanuma S., Powell C.J., and Penn D.R. Surf. Interface Anal. 21 (1994) 165
31. Tanuma S., Powell C.J., and Penn D.R. Surf. Interface Anal. 17 (1991) 911
32. Tanuma S., Powell C.J., and Penn D.R. J. Electron. Spectrosc. Relat. Phenom. 52 (1990) 285
33. Wendt S., Sprunger P.T., Lira E., Madsen G.K.H., Li Z.S., Hansen J.O., Matthiesen J., Blekinge-Rasmussen A., Laegsgaard E., Hammer B., and Besenbacher F. Science 320 (2008) 1755
34. Boschi R., Murrell J.N., and Schmidt W. Faraday Discuss. 54 (1972) 116
35. Frisch M.J., et al. Gaussian 03 (2004), Gaussian, Inc., Wallingford CT
36. Kang S.J., Yi Y., Cho K., Jeong K., Yoo K.-H., and Whang C.N. Synth. Met. 151 (2005) 120
37. Taborski J., Väterlein P., Dietz H., Zimmermann U., and Umbach E. J. Electron Spectrosc. 75 (1995) 129
38. Zimmermann U., Schnitzler G., Wüstenhagen V., Karl N., Dudde R., Koch E.E., and Umbach E. Mol. Cryst. Liq. Cryst. 339 (2000) 231
39. Umbach E. Prog. Surf. Sci. 35 (1991) 113
40. Jung M., Baston U., Schnitzler G., Kaiser M., Papst J., Porwol T., Freund H.J., and Umbach E. J. Mol. Struct. 293 (1993) 239
41. Stöhr J. NEXAFS Spectroscopy (2003), Springer
42. Oji H., Mitsumoto R., Ito E., Ishii H., Ouchi Y., Seki Y., Yokoyama T., Ohta T., and Kosugi N. J. Chem. Phys. 109 (1998) 10409
43. Schoell A., Zou Y., Huebner D., Urquhart S.G., Schmidt Th., Fink R., and Umbach E. J. Chem. Phys. 123 (2005) 044509