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Volumn 311, Issue 8, 2009, Pages 2524-2529
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Preparation and characterizations of thallium bromide single crystal for room temperature radiation detector use
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Author keywords
A1. Characterization; A2. Growth from melt; A2. Single crystal growth; B1. Inorganic compounds; B2. Semiconducting materials
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Indexed keywords
A1. CHARACTERIZATION;
A2. GROWTH FROM MELT;
A2. SINGLE CRYSTAL GROWTH;
B1. INORGANIC COMPOUNDS;
B2. SEMICONDUCTING MATERIALS;
ABSORPTION SPECTROSCOPY;
CHARACTERIZATION;
CRYSTAL GROWTH;
CRYSTALLIZATION;
GRAIN BOUNDARIES;
INORGANIC COMPOUNDS;
SINGLE CRYSTALS;
SUPERCONDUCTING FILMS;
THALLIUM;
VIBRATIONS (MECHANICAL);
X RAY DIFFRACTION ANALYSIS;
SEMICONDUCTOR GROWTH;
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EID: 65249108213
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2008.12.057 Document Type: Article |
Times cited : (10)
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References (11)
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