Series resistance determination of Au/Polypyrrole/p-Si/Al structure by current-voltage measurements at low temperatures

Materials Science and Engineering C

Volumn 29, Issue 4, 2009, Pages 1486-1490

  Aydogan S ^a   Saglam M ^a   Turut A ^a   Onganer, Y ^a  

^a ATATÜRK UNIVERSITY   (Turkey)

Author keywords

Barrier height; Conducting polymers; Ideality factor; Polypyrrole; Series resistance

Indexed keywords

BARRIER HEIGHT; CURRENT-VOLTAGE MEASUREMENTS; I-V CHARACTERISTICS; I-V METHODS; IDEALITY FACTOR; JUNCTION PARAMETERS; LOW TEMPERATURES; P-SI/AL STRUCTURES; SERIES RESISTANCE; THERMIONIC EMISSION THEORIES;

CONDUCTING POLYMERS; CONDUCTIVE PLASTICS; ORGANIC CONDUCTORS; POLYMERS; POLYPYRROLES; THERMIONIC EMISSION;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 64849112495     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msec.2008.12.006     Document Type: Article

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