BTBT transistor scaling: Can they be Competitive with MOSFETs?

Device Research Conference - Conference Digest, DRC

Volumn , Issue , 2008, Pages 75-76

  Woo, Raymond ^a   Serene Koh, H Y ^a   Onal, Caner ^a   Griffin, P B ^a   Plummer, James D ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 64849106142     PISSN: 15483770     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DRC.2008.4800741     Document Type: Conference Paper

References (1)

1. W.Y. Choi et al., IEEE EDL, 28 (8), pp. 743-745, 2007.