Yield strength in nanocrystalline Cu during high strain rate deformation

Scripta Materialia

Volumn 61, Issue 1, 2009, Pages 76-79

  Vo, Nhon Q ^a   Averback, Robert S ^a   Bellon, Pascal ^a   Caro, Alfredo ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b Materials   (United States)

Author keywords

Hall Petch; Molecular dynamics; Nanocrystalline; Yield strength

Indexed keywords

CONTROLLED NOT; GRAIN SIZES; GRAIN-BOUNDARY; HALL-PETCH; HIGH STRAIN RATE DEFORMATIONS; MOLECULAR DYNAMICS SIMULATIONS; NANOCRYSTALLINE; NANOCRYSTALLINE CU; SCALING BEHAVIORS; YIELD STRENGTH;

DYNAMICS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MOLECULAR DYNAMICS; STRAIN RATE; YIELD STRESS;

NANOCRYSTALLINE MATERIALS;

EID: 64849096486     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2009.03.003     Document Type: Article

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