Pyrite films grown by sulfurizing precursive iron of different crystallizing status

Journal of Materials Science and Technology

Volumn 25, Issue 2, 2009, Pages 237-241

  Huang, Liuyi ^a   Liu, Yanhui ^a   Meng, Liang ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Crystal structure; Electrical property; FeS2; Thin film

Indexed keywords

ATOM DIFFUSIONS; BOTTOM LAYERS; COLUMNAR GRAINS; CRYSTALLINITY; ELECTRICAL CHARACTERS; ELECTRICAL PROPERTY; ELECTRICAL RESISTIVITIES; FES2; FINE EQUIAXED GRAINS; GRAIN SIZES; HIGH SUBSTRATE TEMPERATURES; IRON FILMS; IRON GRAINS; SURFACE LAYERS; TRANSFORMATION STRESS;

CARRIER CONCENTRATION; CARRIER MOBILITY; DEFECT DENSITY; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; GRAIN SIZE AND SHAPE; PYRITES; SUBSTRATES; THIN FILM DEVICES; THIN FILMS;

CRYSTAL STRUCTURE;

EID: 64749094524     PISSN: 10050302     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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