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Volumn 344, Issue 1-4, 2004, Pages 489-494
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Positron annihilation study of defects in pyrite FeS2 films prepared by sulfurizing thermally iron films
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Author keywords
Defects; Iron pyrite films; Positron annihilation spectroscopy; Semiconductors
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Indexed keywords
CRYSTALLIZATION;
DEFECTS;
ENERGY GAP;
EPITAXIAL GROWTH;
GLASS;
INTERFACES (MATERIALS);
IRON COMPOUNDS;
METALLIC FILMS;
POSITRON ANNIHILATION SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTOR MATERIALS;
SULFUR;
THERMAL DIFFUSION;
VACUUM APPLICATIONS;
FILM DEPOSITION;
IRON PYRITE FILMS;
SULFUR VACANCIES;
PYRITES;
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EID: 0742302956
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2003.11.083 Document Type: Article |
Times cited : (6)
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References (11)
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