Including electronic effects in damage cascade simulations

Journal of Nuclear Materials

Volumn 386-388, Issue C, 2009, Pages 19-21

  Duffy, D M ^a,b   Rutherford, A M ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b CULHAM SCIENCE CENTRE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SYSTEMS; CONSTANT TEMPERATURES; CONTINUUM MODELS; COUPLING STRENGTHS; DAMAGE CASCADES; DAMAGE SIMULATIONS; ELECTRON-PHONON COUPLING STRENGTHS; ELECTRON-PHONON COUPLINGS; ELECTRONIC EFFECTS; ELECTRONIC ENERGIES; ELECTRONIC FRICTIONS; ELECTRONIC SYSTEMS; ELECTRONIC TEMPERATURES; ENERGY LOST; HEAT DIFFUSION EQUATIONS; LANGEVIN; MD SIMULATIONS; NON-MONOTONIC VARIATIONS; RESIDUAL DEFECTS; STOCHASTIC FORCES; TIME AND SPACES;

CONTINUUM MECHANICS; ELECTRON CORRELATIONS; RADIATION EFFECTS; THERMOSTATS;

ELECTRON-PHONON INTERACTIONS;

EID: 64649091966     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2008.12.051     Document Type: Article

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