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Volumn 58, Issue 5, 1998, Pages 2361-2364
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Defect production in tungsten: A comparison between field-ion microscopy and molecular-dynamics simulations
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001080566
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.58.2361 Document Type: Article |
Times cited : (61)
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References (18)
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