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Volumn 58, Issue 5, 1998, Pages 2361-2364

Defect production in tungsten: A comparison between field-ion microscopy and molecular-dynamics simulations

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Indexed keywords


EID: 0001080566     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.2361     Document Type: Article
Times cited : (61)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.