Advanced image sensor technology for pixel scaling down toward l.Oμm (Invited)

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2008, Pages

  Ahn, Jungchak ^a   Moon, Chang Rok ^a   Kim, Bumsuk ^a   Lee, Kyungho ^a   Kim, Yitae ^a   Lim, Moosup ^a   Lee, Wook ^a   Park, Heemin ^a   Moon, Kyoungsik ^a   Yoo, Jaeryung ^a   Lee, Yongjei ^a   Park, Byungjun ^a   Jung, Sangil ^a   Lee, Junetaeg ^a   Lee, Tae Hun ^a   Lee, Yunki ^a   Jung, Hoon ^a   Kim, Jin Hak ^a   Kim, Tae Chan ^a   Cho, Hyunwoo ^a   Lee, Duckhyung ^a   Lee, Yonghee ^a   more..

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED SENSOR TECHNOLOGIES; ADVANCED TECHNOLOGIES; BACKSIDE ILLUMINATIONS; COLOR FILTER ARRAYS; EXTENDED DEPTH OF FIELDS; LOW LIGHTS; PIXEL SIZES; SCALING DOWNS; SENSOR TECHNOLOGIES; TECHNICAL BARRIERS;

DIGITAL IMAGE STORAGE; ELECTRON DEVICES; IMAGE SENSORS; PIXELS;

TECHNOLOGY;

EID: 64549142768     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2008.4796671     Document Type: Conference Paper

References (11)

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11. M. Ihama, et al., Proc. SPIE, p.6656, 2007.