A comparison of optical microscope- and scanning electron microscope-based cathodoluminescence (CL) imaging and spectroscopy applied to geosciences

Mineralogical Magazine

Volumn 72, Issue 4, 2008, Pages 909-924

  Gotze J ^a   Kempe, U ^a  

^a TU BERGAKADEMIE FREIBERG   (Germany)

Author keywords

Cathodoluminescence; Microscopy; SEM; Spectroscopy

Indexed keywords

ANALYTICAL PARAMETERS; DICKITE; ELECTRON GUN; ELECTRON MICROPROBES; ELECTRON-BEAM; GEOSCIENCES; MICROSCOPY; OPTICAL MICROSCOPES; SCANNING ELECTRON MICROSCOPES; SEM; SIGNAL ACQUISITIONS; SMALL GRAIN SIZES; SPATIAL RESOLUTIONS; SPECTROSCOPIC STUDIES; UV- ANDS; WAVELENGTH RANGES;

AUGER ELECTRON SPECTROSCOPY; CATHODOLUMINESCENCE; CORUNDUM; ELECTRON BEAMS; ELECTRON GUNS; ELECTRON TUBES; ELECTRONS; EMISSION SPECTROSCOPY; FELDSPAR; KAOLINITE; LIGHT EMISSION; MICROSCOPES; OXIDE MINERALS; PHOSPHATE MINERALS; QUARTZ; RARE EARTH ELEMENTS; SCANNING; SCANNING ELECTRON MICROSCOPY; SIGNAL ANALYSIS; SIGNAL PROCESSING; SILICATE MINERALS; SPECTROSCOPIC ANALYSIS; ZIRCON;

INTEGRATED OPTOELECTRONICS;

CATHODOLUMINESCENCE; COMPARATIVE STUDY; DATA ACQUISITION; ELECTRON PROBE ANALYSIS; IMAGE PROCESSING; MICROSCOPY; OPTICAL METHOD; SCANNING ELECTRON MICROSCOPY; SPECTRAL RESOLUTION;

EID: 64549117394     PISSN: 0026461X     EISSN: None     Source Type: Journal    
DOI: 10.1180/minmag.2008.072.4.909     Document Type: Article

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