Advanced simulation of statistical variability and reliability in nano CMOS transistors

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2008, Pages

  Asenov, A ^a   Roy, S ^a   Brown, R A ^a   Roy, G ^a   Alexander, C ^a   Riddet, C ^a   Millar, C ^a   Cheng, B ^a   Martinez, A ^a   Seoane, N ^b   Reid, D ^a   Bukhori, M F ^a   Wang, X ^a   Kovac, U ^a,b  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

^b UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 64549110647     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2008.4796712     Document Type: Conference Paper

References (3)

1. A. Brown at al. IEEE Trans. Electron Dev. 54 3056 (2007).
2. S. E. Rauch III, IEEE Trans. Dev. Mat. Real. 7 524 (2007).
3. H. Onodera, IEICE Trans. Electron. E89-C 342 (2006)