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Volumn 27, Issue 2, 2009, Pages 581-584

Improved etch resistance of ZEP 520A in reactive ion etching through heat and ultraviolet light treatment

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON-BEAM RESISTS; ETCH RESISTANCES; HARD MASKS; LIFT-OFF PROCESS; PATTERN TRANSFERS; REACTIVE IONS; TREATMENT PROCESS; ULTRA-VIOLET LIGHTS;

EID: 64549090105     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3086721     Document Type: Article
Times cited : (9)

References (12)
  • 2
    • 64549097668 scopus 로고    scopus 로고
    • Proceedings of the IEEE First International Conference on Nano/Micro Engineered and Molecular Systems, 18-21 January, Zhuhai, China (unpublished).
    • H. Yang, L. Fan, A. Jin, Q. Luo, C. Gu, and Z. Cui, Proceedings of the IEEE First International Conference on Nano/Micro Engineered and Molecular Systems, 18-21 January 2006, Zhuhai, China (unpublished).
    • (2006)
    • Yang, H.1    Fan, L.2    Jin, A.3    Luo, Q.4    Gu, C.5    Cui, Z.6
  • 5
    • 0026839060 scopus 로고
    • 0013-4651 10.1149/1.2069330.
    • K. Yamaguchi, J. Electrochem. Soc. 0013-4651 10.1149/1.2069330 139, L33 (1992).
    • (1992) J. Electrochem. Soc. , vol.139 , pp. 33
    • Yamaguchi, K.1
  • 7
    • 0000996008 scopus 로고    scopus 로고
    • 0277-786X 10.1117/12.472293.
    • D. J. Resnick, Proc. SPIE 0277-786X 10.1117/12.472293 4688, 205 (2002).
    • (2002) Proc. SPIE , vol.4688 , pp. 205
    • Resnick, D.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.