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Applied Physics Letters

Volumn 94, Issue 14, 2009, Pages

Relevance of length scales in exchange biased submicron dots

(3) Li, Zhi Pan a Morales, R a,b Schuller, Ivan K a

a UNIVERSITY OF CALIFORNIA (United States)

b Parque Tecnológico de Asturias (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNET; COOLING FIELDS; DOT SIZES; EXCHANGE BIAS; EXCHANGE-BIAS FIELDS; EXCHANGE-BIASED NANOSTRUCTURES; LENGTH SCALE; LOWER LIMITS; ORDER OF MAGNITUDES; SIZE DEPENDENCES; STRUCTURE SIZES; SUB MICRONS;

COOLING;

EID: 64349122940 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3114372 Document Type: Article

Times cited : (12)

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