Reversal behavior of exchange-biased submicron dots

Applied Physics Letters

Volumn 86, Issue 7, 2005, Pages 1-3

  Li, Zhi Pan ^a   Petracic, Oleg ^a,b   Eisenmenger, Johannes ^a,c   Schuller, Ivan K ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

^c UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EXCHANGE BIAS (EB) EFFECT; HYSTERESIS LOOPS; INTERFACIAL SPINS; MICROMAGNETIC SIMULATIONS;

ANTIFERROMAGNETIC MATERIALS; COERCIVE FORCE; COMPUTER SIMULATION; FERROMAGNETIC MATERIALS; HYSTERESIS; IRON COMPOUNDS; KERR MAGNETOOPTICAL EFFECT; MAGNETIC FIELDS; THIN FILMS;

NANOSTRUCTURED MATERIALS;

EID: 17044416919     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1863449     Document Type: Article

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