Accurately measuring current-voltage characteristics of tunnel diodes

IEEE Transactions on Electron Devices

Volumn 53, Issue 10, 2006, Pages 2564-2568

  Bao, Mingqiang ^a   Wang, Kang L ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Circuit stability; Current measurement; Second derivative; Tunnel diodes; Tunneling spectroscopy

Indexed keywords

AVERAGE CURRENTS; AVERAGE VALUES; CIRCUIT STABILITY; CURRENT MEASUREMENT; DIODE MEASUREMENTS; ESAKI TUNNELS; I - V CURVES; INTERNAL OSCILLATIONS; MEASUREMENT CIRCUITS; MEASUREMENT DATUM; NEGATIVE DIFFERENTIAL RESISTANCES; OSCILLATION AMPLITUDES; OSCILLATION CHARACTERISTICS; OSCILLATION FREQUENCIES; SECOND DERIVATIVE; TEST CIRCUITS; TUNNELING CURRENTS; TUNNELING SPECTROSCOPY; VOLTAGE RANGES;

DERIVATIVES; DIODES; ELECTRIC CURRENT MEASUREMENT; MEASUREMENTS; MOTION ESTIMATION; PHONONS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SPECTRUM ANALYSIS; TUNNEL DIODES; TUNNELS;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 64349122319     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2006.882281     Document Type: Article

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