The strength of thin films, small structures and materials under localised stresses

Thin Solid Films

Volumn 517, Issue 13, 2009, Pages 3781-3783

  Ehrler, B ^a   Dunstan, D J ^a   Zhu, T T ^a   Hou, X D ^a   P'ng, K M Y ^a   Bushby, A J ^a  

^a QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

Author keywords

Micromechanics; Size effect; Strength; Thin films

Indexed keywords

CRITICAL THICKNESS; SIZE EFFECT; SQUARE ROOTS; STRENGTH; WORK HARDENINGS;

MICROMECHANICS; THIN FILMS;

YIELD STRESS;

EID: 64349101482     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.12.053     Document Type: Article

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