Positron beam characterization of silica thin films with structurally ordered porosity

Materials Science Forum

Volumn 607, Issue , 2009, Pages 99-101

  Yu, R S ^a   Qin, X B ^a,b   Wang, Q Z ^a   Zhang, Z ^a,b   Zhong, Y R ^a,b   Li, Z X ^a   Wang, B Y ^a   Wei, L ^a   Jia, Q J ^a   Kurihara, T ^c  

^a INSTITUTE OF HIGH ENERGY PHYSICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Porous films; Positron annihilation; Positron beam; Positronium

Indexed keywords

ELECTRONS; ETHYLENE; OXIDE FILMS; PARTICLE BEAMS; POLYETHYLENE OXIDES; PORE SIZE; POSITRON ANNIHILATION; POSITRONS; SILICA; SILICON OXIDES;

EQUIVALENT POROSITY; MESOPOROUS SILICON; POROUS FILM; POSITRON BEAM ANALYSIS; POSITRON BEAMS; POSITRONIUM; POSITRONIUM FORMATION; STRUCTURE DIRECTING AGENTS;

THIN FILMS;

EID: 64349098644     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (2)

1. D.W. Gidley, H.G. Peng and R.S. Vallery: Annu. Rev. Mater. Res. Vol. 36 (2006), p. 49
2. J. Bolze, M. Ree and H.S. Youn: Langmuir Vol. 17 (2001), p. 6683