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Volumn 54, Issue 14, 2009, Pages 3766-3774

Ionic double layer of atomically flat gold formed on mica templates

Author keywords

AFM; CPE; EIS; Impedance; Ionic double layer; Surface topography

Indexed keywords

AFM; CPE; EIS; IMPEDANCE; IONIC DOUBLE LAYER;

EID: 64249165816     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2009.01.069     Document Type: Article
Times cited : (19)

References (52)
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    • O. Stern, Z. Elecktrochem. 30 (1924) 508.
  • 36
    • 64249152345 scopus 로고    scopus 로고
    • An improved method of measuring the phase difference between arbitrary periodic waveforms
    • H.G.L. Coster, T.C. Chilcott, "An improved method of measuring the phase difference between arbitrary periodic waveforms", PCT application filed in Australia, 2007.
    • (2007) PCT application filed in Australia
    • Coster, H.G.L.1    Chilcott, T.C.2
  • 38
  • 46
    • 0001590953 scopus 로고    scopus 로고
    • Bard A.J., and Rubinstein I. (Eds), Marcel Dekker Inc., New York, Basel
    • Moffat T.P. In: Bard A.J., and Rubinstein I. (Eds). Electroanalytical Chemistry: A Series of Advances vol. 21 (1999), Marcel Dekker Inc., New York, Basel 211
    • (1999) Electroanalytical Chemistry: A Series of Advances , vol.21 , pp. 211
    • Moffat, T.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.