InGaN selfassembled quantum dots investigated by X-ray diffraction- anomalous-fine structure technique

AIP Conference Proceedings

Volumn 893, Issue , 2007, Pages 79-80

  Piskorska, E ^a   Holy, V ^b   Siebert, M ^c   Renevier, H ^d   Schmidt, T ^c   Falta, J ^c   Yamaguchi, T ^c   Hommel, D ^c  

^a INSTITUTE OF PHYSICS   (Poland)

^b CHARLES UNIVERSITY   (Czech Republic)

^c UNIVERSITY OF BREMEN   (Germany)

^d ASRF   (France)

Author keywords

Chemical compositions; DAFS; III V semiconductors; Quantum dots

Indexed keywords

EID: 64249103100     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2729779     Document Type: Conference Paper

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