Magnetic force microscopy studies of bit erasure in particulate magnetic recording media

Journal of Magnetism and Magnetic Materials

Volumn 226-230, Issue PART II, 2001, Pages 2046-2047

  Kuo, Hsiapo V ^a,b   Merton, Christopher A ^a,b   Dan Dahlberg, E ^a,c  

^a UNIVERSITY OF MINNESOTA   (United States)

^b Imation Company   (United States)

^c Digital Instruments   (United States)

Author keywords

Magnetic alignment; Magnetic force microscopy; Magnetic recording media; Magnetization field dependent

Indexed keywords

MAGNETIC FIELDS; MAGNETIC FORCE MICROSCOPY; MAGNETIC RECORDING; MAGNETIZATION; SURFACE ROUGHNESS;

APPLIED MAGNETIC FIELDS; AVERAGE SURFACE ROUGHNESS; MAGNETIC ALIGNMENT; MAGNETIC FORCE MICROSCOPIES (MFM); MAGNETIC RECORDING MEDIA; MAGNETIZATION PATTERNS; QUALITATIVE ANALYSIS; THIN FILM RECORDING MEDIA;

MAGNETISM;

EID: 63649139708     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(00)00819-2     Document Type: Article

References (3)

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2. M. Sharrook, Imation Corp., Data Storage and Information Management, 1999.
3. B. Walsh, S. Austvold, R. Proksch, J. Appl. Phys. 84 (1998) 5709.