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Volumn 84, Issue 10, 1998, Pages 5709-5714

Magnetic force microscopy of avalanche dynamics in magnetic media

Author keywords

[No Author keywords available]

Indexed keywords

COBALT ALLOYS; COERCIVE FORCE; DYNAMICS; FERROMAGNETIC MATERIALS; MAGNETIC DOMAINS; MAGNETIC FIELDS; MAGNETIC THIN FILMS; MAGNETIZATION; MAGNETOSTATICS; MICROSCOPIC EXAMINATION; SIMULATION;

EID: 0032533111     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368835     Document Type: Article
Times cited : (11)

References (30)
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    • Digital Instruments, Santa Barbara, CA 93117
    • Digital Instruments, Santa Barbara, CA 93117.
  • 11
    • 85034485961 scopus 로고    scopus 로고
    • MESP cantilevers, Digital Instruments, Santa Barbara, CA
    • MESP cantilevers, Digital Instruments, Santa Barbara, CA.
  • 16
    • 36549092318 scopus 로고
    • Magnetic Force Microscopy
    • Springer, Berlin
    • See, for example, D. Rugar, H. J. Mamin, P. Guenther, S. E. Lambert, J. E. Stern, I. McFayden, and T. Yogi, J. Appl. Phys. 68, 1169 (1990) or P. Grütter, H. J. Mamin, and D. Rugar, "Magnetic Force Microscopy" in Scanning Tunneling Microscopy II (Springer, Berlin, 1992).
    • (1992) Scanning Tunneling Microscopy II
    • Grütter, P.1    Mamin, H.J.2    Rugar, D.3
  • 18
    • 0030244996 scopus 로고    scopus 로고
    • private communication
    • M. Scheinfein (private communication). See also Streblechenko et al., IEEE Trans. Magn. 32, 4124 (1996).
    • Scheinfein, M.1
  • 19
    • 0030244996 scopus 로고    scopus 로고
    • M. Scheinfein (private communication). See also Streblechenko et al., IEEE Trans. Magn. 32, 4124 (1996).
    • (1996) IEEE Trans. Magn. , vol.32 , pp. 4124
    • Streblechenko1
  • 20
    • 85034477938 scopus 로고    scopus 로고
    • Several examples are available for download from http://www.di.com/home/rp/.
  • 22
    • 15744401041 scopus 로고
    • P. Bak, C. Tang, and K. Weisenfeld, Phys. Rev. Lett. 59, 381 (1987); Phys. Rev. A 38, 364 (1988).
    • (1988) Phys. Rev. A , vol.38 , pp. 364
  • 28
    • 85034467776 scopus 로고    scopus 로고
    • note
    • We have changed the interactions in two different ways, the first by varying the tip-sample separation during the scanning process, the second by changing the magnetic coatings used on the silicon cantilevers. Since the MFM operates in TappingMode/LiftMode, the cantilever is at essentially zero sample-tip separation for half the imaging cycle. During this part of the scan, the magnetic field due to the tip will be at its maximum, independent of the lift height. Changing the coating thickness allows more direct control of the magnetic field from the tip.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.