New imaging technique based on diffraction of a focused x-ray beam

Journal of Physics D: Applied Physics

Volumn 42, Issue 1, 2009, Pages

  Kazimirov, A ^a   Kohn, V G ^b   Cai, Z H ^c  

^a Department of Obstetrics Gynecology   (United States)

^b KURCHATOV INSTITUTE   (Russian Federation)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; HOLOGRAPHIC INTERFEROMETRY; IMAGING TECHNIQUES;

CCD DETECTORS; CRYSTALLINE SAMPLES; DIFFRACTION PLANES; DIFFUSE SCATTERINGS; FOCAL PLANES; FOCAL SPOTS; FOCUSING OPTICS; FRESNEL ZONE PLATES; HIGH RESOLUTIONS; INTENSITY PATTERNS; NEW APPROACHES; NON UNIFORMITIES; SILICON ON INSULATORS; STRAIN PROFILES; THIN LAYERS; X-RAY BEAMS;

DIFFRACTION;

EID: 63649087722     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/1/012005     Document Type: Article

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