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Volumn 58, Issue 4, 2009, Pages 1017-1022

The calibration of IEC standard flickermeters using complex modulated signals

Author keywords

Calibration; Digital filters; Electromagnetic compatibility; Flicker; Flickermeter; Power quality; Standards

Indexed keywords

CALIBRATION; DIGITAL FILTERS; ELECTRIC INVERTERS; ELECTRIC MEASURING INSTRUMENTS; ELECTROMAGNETIC COMPATIBILITY; LABORATORIES; STANDARDS;

EID: 63449111784     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.2011088     Document Type: Conference Paper
Times cited : (9)

References (12)
  • 3
    • 63449116530 scopus 로고    scopus 로고
    • Methods for the calibration of flickermeters
    • Washington, DC
    • P. S. Wright and P. Clarkson, "Methods for the calibration of flickermeters," in, Proc. NCSL Int., Washington, DC, 2001.
    • (2001) Proc. NCSL Int
    • Wright, P.S.1    Clarkson, P.2
  • 4
    • 0036703737 scopus 로고    scopus 로고
    • A test system for calibrating flickermeters
    • Aug
    • R. Arseneau, M. F. Sutherland, and J. J. Zelle, "A test system for calibrating flickermeters," IEEE Trans. Instrum. Meas. vol. 51, no. 4, pp. 598-600, Aug. 2002.
    • (2002) IEEE Trans. Instrum. Meas , vol.51 , Issue.4 , pp. 598-600
    • Arseneau, R.1    Sutherland, M.F.2    Zelle, J.J.3
  • 5
    • 17444390777 scopus 로고    scopus 로고
    • Precision measurement of power harmonics and flicker
    • Apr
    • I. Budovsky, "Precision measurement of power harmonics and flicker," IEEE Trans. Instrum. Meas., vol. 54, no. 2, pp. 483-487, Apr. 2005.
    • (2005) IEEE Trans. Instrum. Meas , vol.54 , Issue.2 , pp. 483-487
    • Budovsky, I.1
  • 6
    • 46849092583 scopus 로고    scopus 로고
    • Digital signal processing based waveform generator for flickermeter calibration test system
    • Selangor, Malaysia, Jun
    • S. L. Huoy, S. S. Jamuar, R. M. Sidek, and M. H. Marhaban, "Digital signal processing based waveform generator for flickermeter calibration test system," in Proc. SCOReD, Selangor, Malaysia, Jun. 2006, pp. 108-111.
    • (2006) Proc. SCOReD , pp. 108-111
    • Huoy, S.L.1    Jamuar, S.S.2    Sidek, R.M.3    Marhaban, M.H.4
  • 7
    • 4043055724 scopus 로고    scopus 로고
    • Implementation of a test system for advanced calibration and performance analysis of flickermeters*
    • Aug
    • D. Gallo, C. Landi, R. Langella, and A. Testa, "Implementation of a test system for advanced calibration and performance analysis of flickermeters*: IEEE Trans. Instrum. Meas., vol. 53, no. 4, pp. 1078-1085, Aug. 2004.
    • (2004) IEEE Trans. Instrum. Meas , vol.53 , Issue.4 , pp. 1078-1085
    • Gallo, D.1    Landi, C.2    Langella, R.3    Testa, A.4
  • 8
    • 51949086788 scopus 로고    scopus 로고
    • The calibration of IEC standard flickermeters using complex modulated signals
    • Broomfield, CO, Jun
    • P. Clarkson and P. S. Wright, "The calibration of IEC standard flickermeters using complex modulated signals," in Proc. CPEM Conf. Dig., Broomfield, CO, Jun. 2008.
    • (2008) Proc. CPEM Conf. Dig
    • Clarkson, P.1    Wright, P.S.2
  • 10
    • 0003340924 scopus 로고    scopus 로고
    • Calculatnig a new reference point for the IEC standard flickermeter
    • Dec
    • W. Mombauer, "Calculatnig a new reference point for the IEC standard flickermeter," Eur Trans. Elect. Power, vol. 8, pt. 6, pp. 429-436, Dec. 1998
    • (1998) Eur Trans. Elect. Power , vol.8 , Issue.PART. 6 , pp. 429-436
    • Mombauer, W.1
  • 11
    • 63449114294 scopus 로고    scopus 로고
    • accessed Jun. 4, 2008, Online, Available
    • National Physical Laboratory, NPL Power Quality Waveform Library. accessed Jun. 4, 2008. [Online]. Available: http://resource.npl.co.uk/ waveform/
    • NPL Power Quality Waveform Library
  • 12
    • 33845417251 scopus 로고    scopus 로고
    • Flicker caused by phase jumps
    • Nov./Dec
    • W. Mombauer, "Flicker caused by phase jumps," Eur. Trans. Elect. Power, vol. 16, no. 6, pp. 545-567, Nov./Dec. 2006.
    • (2006) Eur. Trans. Elect. Power , vol.16 , Issue.6 , pp. 545-567
    • Mombauer, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.