Influence of bottom electrodes and interface layers on (Ba,Sr)TiO 3 thin film leakage current

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 8 A, 2004, Pages 5221-5230

  Yamato, Masaki ^a   Yamada, Hiroshi ^a   Kikkawa, Takamaro ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

BST; Dielectric relaxation current; Electrode; Leakage current; Poole Frenkel

Indexed keywords

BARIUM COMPOUNDS; CAPACITORS; DIELECTRIC RELAXATION; ELECTRODES; INTERFACES (MATERIALS); IRIDIUM; LEAKAGE CURRENTS; TANTALUM; TITANIUM;

BST; DIELECTRIC RELAXATION CURRENT; INTERFACE LAYERS; POOLE-FRENKEL;

THIN FILMS;

EID: 6344292275     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.5221     Document Type: Article

References (5)

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