Physically-based approach to deep-submicron MOSFET compact model parameter extraction

2002 International Conference on Modeling and Simulation of Microsystems - MSM 2002

Volumn , Issue , 2002, Pages 750-753

  Chiah, Siau Ben ^a   Zhou, Xing ^a   Lim, Khee Yong ^b   See, Alex ^b   Chan, Lap ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b CHARTERED SEMICONDUCTOR MANUFACTURING LTD   (Singapore)

Author keywords

Compact model; Deep submicron MOSFET; Nonlinear regression; Optimization; Parameter extraction

Indexed keywords

COMPACT MODEL; DEEP-SUBMICRON MOSFET; NONLINEAR REGRESSION; PARAMETER EXTRACTION;

CALIBRATION; COMPUTER SIMULATION; DATABASE SYSTEMS; ITERATIVE METHODS; MATHEMATICAL MODELS; OPTIMIZATION; PARAMETER ESTIMATION; REGRESSION ANALYSIS;

MOSFET DEVICES;

EID: 6344290028     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. X. Zhou and K. Y. Lim, IEEE Trans. Electron Devices, Vol. 48, No. 5, pp. 887-896, May 2001.
2. S. B. Chiah, X. Zhou, K. Y. Lim, Y. Wang, A. See, and L. Chan, Proc. MSM2001, Hilton Head Island, SC, Mar. 2001, pp. 486-489.
3. X. Zhou, K. Y. Lim, and W. Qian, Solid-Slate Electron., Vol. 45, No. 3, pp. 507-510, Apr. 2001.
4. Y. Cheng, et al., BSIM3v3 Manual, Univ. of California, Berkeley, CA, 1997-1998.
5. K. Y. Lim and X. Zhou, to appear in IEEE Trans. Electron Devices, Vol. 49, No. 1, Jan. 2002.
6. W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes in C, Cambridge Univ. Press, 2nd edition, 1992, Chap. 15, p. 683.