Full-band particle-based simulation of germanium-on-insulator FETs

2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004

Volumn 2, Issue , 2004, Pages 25-28

  Beysserie, S ^a   Branlard, J ^a   Aboud, S ^a,c   Goodnick, S ^b   Thornton, T ^b   Saraniti, M ^a  

^a Illinois Institute of Technology   (United States)

^b Arizona State University   (United States)

^c RUSH MEDICAL COLLEGE   (United States)

Author keywords

Frequency analysis; Full band simulation; Germanium; High K dielectric; SOI MOSFET

Indexed keywords

CELLULAR MONTE CARLO (CMC) METHOD; DISCRETIZATIONS; FREQUENCY ANALYSIS; FULL-BAND SIMULATIONS;

COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRIC INSULATORS; IONIZATION; MATHEMATICAL MODELS; MONTE CARLO METHODS; NATURAL FREQUENCIES; SEMICONDUCTING GERMANIUM; SILICON ON INSULATOR TECHNOLOGY;

MOSFET DEVICES;

EID: 6344287657     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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