High-density read-only memory disc with Ag11In 12Sb51Te26 super-resolution mask layer

Chinese Physics Letters

Volumn 21, Issue 10, 2004, Pages 1973-1975

  Zhang, Feng ^a   Wang, Yang ^a   Xu, Wen Dong ^a   Shi, Hong Ren ^a   Wei, Jing Song ^a   Gan, Fu Xi ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

INDIUM COMPOUNDS; READOUT SYSTEMS; SILVER COMPOUNDS; TELLURIUM COMPOUNDS;

CARRIER TO NOISE RATIO; DYNAMIC SETUP; FILM-THICKNESS; MASK LAYER; NUMERICAL APERTURE; READ ONLY MEMORY DISK; READOUT POWER; READOUT VELOCITY; RESOLUTION LIMITS; SUPERRESOLUTION;

ANTIMONY COMPOUNDS;

EID: 6344285581     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/21/10/030     Document Type: Article

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