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Volumn C, Issue , 2003, Pages 2899-2904
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Metastable defect in CZ-SI: Electrical properties and quantitative correlation with different impurities
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Author keywords
[No Author keywords available]
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Indexed keywords
DEFECT CENTERS;
DEGRADATION CYCLES;
METASTABLE DEFECTS;
THERMAL PRETREATMENT;
CONCENTRATION (PROCESS);
CRYSTAL DEFECTS;
CRYSTAL IMPURITIES;
DATABASE SYSTEMS;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
HEAT TREATMENT;
SEMICONDUCTING BORON;
CRYSTAL GROWTH FROM MELT;
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EID: 6344257151
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (15)
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