메뉴 건너뛰기




Volumn C, Issue , 2003, Pages 2899-2904

Metastable defect in CZ-SI: Electrical properties and quantitative correlation with different impurities

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT CENTERS; DEGRADATION CYCLES; METASTABLE DEFECTS; THERMAL PRETREATMENT;

EID: 6344257151     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.