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Lifetime investigations of degradation effects in processed multicrystalline silicon wafers
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Munich, Oct.
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C. Ballif, S. Peters, D. Borchert, C. Hassler, J. Isenberg, R. Schindler, W. Warta, G. Willeke, "Lifetime Investigations of Degradation Effects in Processed Multicrystalline Silicon Wafers". Proc. 17th EPSEC, Munich, Oct. 2001 pg. 1818.
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Ballif, C.1
Peters, S.2
Borchert, D.3
Hassler, C.4
Isenberg, J.5
Schindler, R.6
Warta, W.7
Willeke, G.8
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Spatially resolved lifetime investigations of Al-and P-gettering in conbination with remote plasma passivation in EFG ribbon silicon
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P. Geiger, G. Kragler, G. Hahn, P. Fath, E. Bucher, "Spatially Resolved Lifetime Investigations of Al-and P-Gettering in Conbination with Remote Plasma Passivation in EFG Ribbon Silicon", Ibid. pg. 1715.
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Proc. 17th EPSEC
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Geiger, P.1
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Hahn, G.3
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Analysis of the effect of diffusion length distributions on global solar cell parameters by simplified 2D modelling
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Correlation of spatially resolved lifetime measurements with overall solar cell parameters
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Isenberg, J.1
Dicker, J.2
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Schindler, R.7
Warta, W.8
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5
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0007902229
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Applications of the quasi-steady-state photoconductance technique
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Vienna
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Andres Cuevas, Matthew Stocks, Daniel Macdonald, and Ronald Sinton, "Applications of the Quasi-Steady-State Photoconductance Technique", Proc. 2nd World Conf. On PVSEC, Vienna, 1998 pg. 1236.
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0000057494
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PC1D version 5: 32-bit solar cell modeling on personal computers
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Experimental results of a method for industrial characterization of crystalline silicon wafers
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October
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Colleti G., De Iullis S., Galluppi, M., Nacci,V. R., Ferrazza, F., "Experimental Results of a Method For Industrial Characterization of Crystalline Silicon Wafers", Proceedings of the International Conference, PV in Europe from PV Technology to Energy Solution, pg. 71-74, October 2002.
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Colleti, G.1
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Galluppi, M.3
Nacci, V.R.4
Ferrazza, F.5
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