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Volumn B, Issue , 2003, Pages 1233-1236

Impurity and defect passivation in poly-Si films fabricated by aluminium-induced crystallisation

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM-INDUCED CRYSTALLIZATION (ALC); GLASS SUBSTRATES; SURFACE OPTIMIZATION;

EID: 6344231595     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (13)
  • 1
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    • Aluminium-induced crystallization of amorphous silicon on glass substrates above and below the eutectic temperature
    • O. Nast, T. Puzzer, L.M. Koshier, A.B. Sproul and S.R. Wenham, "Aluminium-induced crystallization of amorphous silicon on glass substrates above and below the eutectic temperature", Appl. Phys. Lett 73, 3214 (1998).
    • (1998) Appl. Phys. Lett , vol.73 , pp. 3214
    • Nast, O.1    Puzzer, T.2    Koshier, L.M.3    Sproul, A.B.4    Wenham, S.R.5
  • 3
    • 0033337764 scopus 로고    scopus 로고
    • Polycrystalline silicon thin-films on glass by aluminium-induced crystallisation
    • O. Nast, S. Brehme, D.H. Neuhaus, and S.R. Wenham, "Polycrystalline Silicon Thin-films on Glass by Aluminium-Induced Crystallisation" IEEE Trans. Electr. Dev. 46, 2062 (1999).
    • (1999) IEEE Trans. Electr. Dev. , vol.46 , pp. 2062
    • Nast, O.1    Brehme, S.2    Neuhaus, D.H.3    Wenham, S.R.4
  • 4
    • 0036645207 scopus 로고    scopus 로고
    • Surface morphology of poly-Si films made by aluminium-induced crystallisation on glass substrates
    • P.I. Widenborg and A.G. Aberle, "Surface morphology of poly-Si films made by aluminium-induced crystallisation on glass substrates", J. Cryst. Growth 242, 270 (2002).
    • (2002) J. Cryst. Growth , vol.242 , pp. 270
    • Widenborg, P.I.1    Aberle, A.G.2
  • 5
    • 6344292161 scopus 로고    scopus 로고
    • "Method of Preparation for polycrystalline Semiconductor Films", Australian Provisional Patent Application 2002951838, filed 9th Dec.
    • P.I. Widenborg, D.H. Neuhaus, O. Nast, and A.G. Aberle, "Method of Preparation for polycrystalline Semiconductor Films", Australian Provisional Patent Application 2002951838, filed 9th Dec. 2002.
    • (2002)
    • Widenborg, P.I.1    Neuhaus, D.H.2    Nast, O.3    Aberle, A.G.4
  • 6
    • 0036777889 scopus 로고    scopus 로고
    • Dependence of recombination in thin-film Si solar cells grown by ion-assisted deposition on the crystallographic orientation of the substrate
    • D.H. Neuhaus, N.-P. Harder, S. Oelting, R. Bardos, A.B. Sproul, P. Widenborg and A.G. Aberle, "Dependence of Recombination in Thin-Film Si Solar Cells Grown by Ion-assisted Deposition on the Crystallographic Orientation of the Substrate", Solar Energy Mat. Solar Cells 74, 225 (2002).
    • (2002) Solar Energy Mat. Solar Cells , vol.74 , pp. 225
    • Neuhaus, D.H.1    Harder, N.-P.2    Oelting, S.3    Bardos, R.4    Sproul, A.B.5    Widenborg, P.6    Aberle, A.G.7
  • 7
    • 0020113926 scopus 로고
    • Crystallographic contrast due to primary ion channelling in the scanning ion microscope
    • P.H. La Marche, R. Levi-Setti and K. Lam, "Crystallographic contrast due to primary ion channelling in the scanning ion microscope", IEEE Trans.Nuc. Sci. NS-30, 1240 (1983).
    • (1983) IEEE Trans.Nuc. Sci. , vol.NS-30 , pp. 1240
    • La Marche, P.H.1    Levi-Setti, R.2    Lam, K.3
  • 9
    • 0029306789 scopus 로고
    • Optical properties of intrinsic silicon at 300 K
    • M.A. Green and M.J. Keevers, "Optical Properties of Intrinsic Silicon at 300 K", Prog. Photov. 3, 189 (1995).
    • (1995) Prog. Photov. , vol.3 , pp. 189
    • Green, M.A.1    Keevers, M.J.2
  • 11
    • 0025385830 scopus 로고
    • Assessment of surface quality of SIMOX wafers by UV reflectance
    • G. Harbeke and L. Jastrzebski, "Assessment of Surface Quality of SIMOX Wafers by UV Reflectance", J. Electrochem. Soc. 137, 696 (1990).
    • (1990) J. Electrochem. Soc. , vol.137 , pp. 696
    • Harbeke, G.1    Jastrzebski, L.2
  • 12
    • 6344244874 scopus 로고    scopus 로고
    • Assessment of surface structure and quality of smooth AIC poly-Si films by UV reflectance and FIB ion channelling
    • to be submitted to
    • P.I. Widenborg et al. "Assessment of Surface Structure and Quality of smooth AIC poly-Si films by UV Reflectance and FIB ion channelling", to be submitted to J. Appl. Phys.
    • J. Appl. Phys.
    • Widenborg, P.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.