-
1
-
-
0001761088
-
Aluminium-induced crystallization of amorphous silicon on glass substrates above and below the eutectic temperature
-
O. Nast, T. Puzzer, L.M. Koshier, A.B. Sproul and S.R. Wenham, "Aluminium-induced crystallization of amorphous silicon on glass substrates above and below the eutectic temperature", Appl. Phys. Lett 73, 3214 (1998).
-
(1998)
Appl. Phys. Lett
, vol.73
, pp. 3214
-
-
Nast, O.1
Puzzer, T.2
Koshier, L.M.3
Sproul, A.B.4
Wenham, S.R.5
-
2
-
-
84949550182
-
Minority carrier properties of single and poly-crystalline silicon films formed by aluminium-induced crystallization
-
D.H. Neuhaus, R. Bardos, L. Feitknecht, T. Puzzer, M.J. Keevers, A.G. Aberle, "Minority Carrier Properties of Single and Poly-crystalline Silicon Films Formed by Aluminium-induced Crystallization", Proc. 28th IEEE Photovoltaic Specialists Conference, p. 104 (2000).
-
(2000)
Proc. 28th IEEE Photovoltaic Specialists Conference
, pp. 104
-
-
Neuhaus, D.H.1
Bardos, R.2
Feitknecht, L.3
Puzzer, T.4
Keevers, M.J.5
Aberle, A.G.6
-
3
-
-
0033337764
-
Polycrystalline silicon thin-films on glass by aluminium-induced crystallisation
-
O. Nast, S. Brehme, D.H. Neuhaus, and S.R. Wenham, "Polycrystalline Silicon Thin-films on Glass by Aluminium-Induced Crystallisation" IEEE Trans. Electr. Dev. 46, 2062 (1999).
-
(1999)
IEEE Trans. Electr. Dev.
, vol.46
, pp. 2062
-
-
Nast, O.1
Brehme, S.2
Neuhaus, D.H.3
Wenham, S.R.4
-
4
-
-
0036645207
-
Surface morphology of poly-Si films made by aluminium-induced crystallisation on glass substrates
-
P.I. Widenborg and A.G. Aberle, "Surface morphology of poly-Si films made by aluminium-induced crystallisation on glass substrates", J. Cryst. Growth 242, 270 (2002).
-
(2002)
J. Cryst. Growth
, vol.242
, pp. 270
-
-
Widenborg, P.I.1
Aberle, A.G.2
-
5
-
-
6344292161
-
-
"Method of Preparation for polycrystalline Semiconductor Films", Australian Provisional Patent Application 2002951838, filed 9th Dec.
-
P.I. Widenborg, D.H. Neuhaus, O. Nast, and A.G. Aberle, "Method of Preparation for polycrystalline Semiconductor Films", Australian Provisional Patent Application 2002951838, filed 9th Dec. 2002.
-
(2002)
-
-
Widenborg, P.I.1
Neuhaus, D.H.2
Nast, O.3
Aberle, A.G.4
-
6
-
-
0036777889
-
Dependence of recombination in thin-film Si solar cells grown by ion-assisted deposition on the crystallographic orientation of the substrate
-
D.H. Neuhaus, N.-P. Harder, S. Oelting, R. Bardos, A.B. Sproul, P. Widenborg and A.G. Aberle, "Dependence of Recombination in Thin-Film Si Solar Cells Grown by Ion-assisted Deposition on the Crystallographic Orientation of the Substrate", Solar Energy Mat. Solar Cells 74, 225 (2002).
-
(2002)
Solar Energy Mat. Solar Cells
, vol.74
, pp. 225
-
-
Neuhaus, D.H.1
Harder, N.-P.2
Oelting, S.3
Bardos, R.4
Sproul, A.B.5
Widenborg, P.6
Aberle, A.G.7
-
7
-
-
0020113926
-
Crystallographic contrast due to primary ion channelling in the scanning ion microscope
-
P.H. La Marche, R. Levi-Setti and K. Lam, "Crystallographic contrast due to primary ion channelling in the scanning ion microscope", IEEE Trans.Nuc. Sci. NS-30, 1240 (1983).
-
(1983)
IEEE Trans.Nuc. Sci.
, vol.NS-30
, pp. 1240
-
-
La Marche, P.H.1
Levi-Setti, R.2
Lam, K.3
-
8
-
-
0000353360
-
Neutralization of shallow acceptor levels in silicon by atomic hydrogen
-
J.I. Pankove, D.E. Carlson, J.E. Berkeyheiser and R.O. Wance, "Neutralization of Shallow Acceptor Levels in Silicon by Atomic Hydrogen", Phys. Rev. Lett. 51, 2224 (1983).
-
(1983)
Phys. Rev. Lett.
, vol.51
, pp. 2224
-
-
Pankove, J.I.1
Carlson, D.E.2
Berkeyheiser, J.E.3
Wance, R.O.4
-
9
-
-
0029306789
-
Optical properties of intrinsic silicon at 300 K
-
M.A. Green and M.J. Keevers, "Optical Properties of Intrinsic Silicon at 300 K", Prog. Photov. 3, 189 (1995).
-
(1995)
Prog. Photov.
, vol.3
, pp. 189
-
-
Green, M.A.1
Keevers, M.J.2
-
11
-
-
0025385830
-
Assessment of surface quality of SIMOX wafers by UV reflectance
-
G. Harbeke and L. Jastrzebski, "Assessment of Surface Quality of SIMOX Wafers by UV Reflectance", J. Electrochem. Soc. 137, 696 (1990).
-
(1990)
J. Electrochem. Soc.
, vol.137
, pp. 696
-
-
Harbeke, G.1
Jastrzebski, L.2
-
12
-
-
6344244874
-
Assessment of surface structure and quality of smooth AIC poly-Si films by UV reflectance and FIB ion channelling
-
to be submitted to
-
P.I. Widenborg et al. "Assessment of Surface Structure and Quality of smooth AIC poly-Si films by UV Reflectance and FIB ion channelling", to be submitted to J. Appl. Phys.
-
J. Appl. Phys.
-
-
Widenborg, P.I.1
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