Systematic study of the mirror effect in a poly-Si subwavelength periodic membrane

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 26, Issue 3, 2009, Pages 559-565

  Sang, Tian ^a,b   Wang, Li ^a   Ji, Shiyin ^b   Ji, Yiqin ^c   Chen, Hong ^a   Wang, Zhanshan ^a  

^a TONGJI UNIVERSITY   (China)

^b Qiannan Normal University for Nationalities   (China)

^c TIANJIN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; LIGHT MEASUREMENT; MIRRORS; OPTICAL FILTERS; POLYSILICON; RESONANCE; SEMICONDUCTING SILICON COMPOUNDS; TELECOMMUNICATION SYSTEMS; WAVEGUIDES;

BROADBAND REFLECTIONS; DIFFRACTION ORDERS; EIGENVALUE EQUATIONS; FILLING FACTORS; FLAT BANDS; GRATING PERIODS; GUIDED-MODE RESONANCES; HIGH REFLECTIVITIES; INCIDENT ANGLES; LAYER THICKNESS; LEAKY WAVEGUIDES; PHYSICAL MECHANISMS; POLY-SI; POLY-SI THIN FILMS; REFLECTION BANDS; SUB WAVELENGTHS; SYSTEMATIC STUDIES; WAVEGUIDE GRATINGS;

REFLECTION;

EID: 63349088014     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.26.000559     Document Type: Article

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