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Volumn 19, Issue 4, 2008, Pages 341-347

Bond strength of a pit-and-fissure sealant associated to etch-and-rinse and self-etching adhesive systems to saliva-contaminated enamel: Individual vs. simultaneous light curing

Author keywords

Adhesive system; Light curing; Pit and fissure sealant; Salivary contamination; Shear bond strength

Indexed keywords

BISPHENOL A BIS(2 HYDROXYPROPYL) ETHER DIMETHACRYLATE; DENTIN BONDING AGENT; FISSURE SEALANT; FLUOROSHIELD; POLYURETHAN; RESIN CEMENT;

EID: 63249112427     PISSN: 01036440     EISSN: 18064760     Source Type: Journal    
DOI: 10.1590/s0103-64402008000400010     Document Type: Article
Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.