Efficient techniques for directed test generation using incremental satisfiability

Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems

Volumn , Issue , 2009, Pages 65-70

  Mishra, Prabhat ^a   Chen, Mingsong ^a  

^a University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS; TESTING;

FUNCTIONAL VALIDATIONS; INCREMENTAL SATISFIABILITY; NOVEL METHODOLOGIES; SOC DESIGNS; TEST GENERATION METHODOLOGIES; TEST GENERATIONS;

EMBEDDED SYSTEMS;

EID: 63149189291     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSI.Design.2009.72     Document Type: Conference Paper

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