Fabrication and characterization of eutectic bismuth-tin (Bi-Sn) nanowires

Materials Letters

Volumn 63, Issue 13-14, 2009, Pages 1165-1168

  Chen, Shih Hsun ^a   Chen, Chien Chon ^b   Luo, Z P ^c   Chao, Chuen Guang ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL UNITED UNIVERSITY   (Taiwan)

^c Department of Electrical and Computer Engineering   (United States)

Author keywords

Bi Sn eutectic alloy; Electron microscopy; Microstructure; Nanowires

Indexed keywords

ALUMINA; BISMUTH; ELECTRIC WIRE; EUTECTICS; FABRICATION; MICROSTRUCTURE; NANOWIRES; TIN; TITANIUM COMPOUNDS;

ANODIC ALUMINUM OXIDES; BI-SN EUTECTIC ALLOY; ELECTRON DIFFRACTION ANALYSIS; EUTECTIC MICROSTRUCTURES; FABRICATION PROCESS; HYDRAULIC PRESSURES; SINGLE-CRYSTALLINE STRUCTURES; WEIGHT PERCENTS; WIRE DIAMETERS;

TIN ALLOYS;

EID: 63149179116     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2009.02.019     Document Type: Article

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