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Volumn 16, Issue 8, 2009, Pages 243-249

3D wafer-scale integration for RF and digital applications

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DIGITAL DEVICES; SEMICONDUCTOR DEVICES; SUBSTRATES; WAFER BONDING; WSI CIRCUITS;

EID: 63149147409     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2982875     Document Type: Conference Paper
Times cited : (1)

References (4)
  • 1
    • 57649093180 scopus 로고    scopus 로고
    • A Gutierrez-Aitken, Epitaxial and non-epitaxial Heterogeneous integration technologies at NGST MRS Spring 2008 Proceeding, San Francisco CA, March 2008, paper number 1068-C02-02
    • A Gutierrez-Aitken, "Epitaxial and non-epitaxial Heterogeneous integration technologies at NGST" MRS Spring 2008 Proceeding, San Francisco CA, March 2008, paper number 1068-C02-02
  • 4
    • 84887483496 scopus 로고    scopus 로고
    • R. Sandhu, P. Chang-Chien, M. Parlee, B. Poust, T. Chung, R. Tsai, A. Noori, V. Temsevary, O. Fordham, X. Zeng, K. Tornquist, D. Duan, T. P. Chin, and M. Barsky Thermal-Mechanical Characterization of Wafer Level Packaging Technologies 2008 CSManTech, Chicago IL, April 2008, paper number 14.4
    • R. Sandhu, P. Chang-Chien, M. Parlee, B. Poust, T. Chung, R. Tsai, A. Noori, V. Temsevary, O. Fordham, X. Zeng, K. Tornquist, D. Duan, T. P. Chin, and M. Barsky "Thermal-Mechanical Characterization of Wafer Level Packaging Technologies" 2008 CSManTech, Chicago IL, April 2008, paper number 14.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.