Fabrication and characterization of lead sulfide thin films by atomic layer deposition

ECS Transactions

Volumn 16, Issue 4, 2009, Pages 29-36

  Dasgupta, Neil P ^a   Walch, Stephen P ^a   Prinz, Fritz B ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; DENSITY FUNCTIONAL THEORY; FILM GROWTH; GROWTH RATE; IV-VI SEMICONDUCTORS; LEAD COMPOUNDS; SULFUR COMPOUNDS; THIN FILMS;

FABRICATION AND CHARACTERIZATIONS; FILM PROPERTIES; GRAIN SIZE; LEAD SULFIDE; LINEAR GROWTH RATE; POLYCRYSTALLINE; REACTION MECHANISM; SUBLIMATION TEMPERATURE;

ATOMIC LAYER DEPOSITION;

EID: 63149134935     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2979978     Document Type: Conference Paper

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