A defect-driven process for software quality improvement

ESEM'08: Proceedings of the 2008 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement

Volumn , Issue , 2008, Pages 333-335

  Robinson, Brian ^a   Francis, Patrick ^a   Ekdahl, Fredrik ^b  

^a ABB INC   (United States)

^b ABB CORPORATE RESEARCH   (Sweden)

Author keywords

Defect classification; Empirical study; Software quality improvement

Indexed keywords

DEFECTS; SOFTWARE ENGINEERING;

DEFECT CLASSIFICATION; DEVELOPMENT PROCESS; EMPIRICAL STUDY; PROCESS YIELDS; SOFTWARE DEVELOPMENT; SOFTWARE QUALITY IMPROVEMENT;

COMPUTER SOFTWARE SELECTION AND EVALUATION;

EID: 63149123668     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1414004.1414072     Document Type: Conference Paper

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