Learning from our mistakes with defect causal analysis

IEEE Software

Volumn 15, Issue 1, 1998, Pages 56-63

  Card, David N ^{a,b,c,d,e,f,g}  

^a Software Productivity Consortium   (United States)

^b Computer Sciences Corporation ^*  (United States)

^c Software Engineering Institute   (United States)

^d NASA Software Engineering Laboratory   (United States)

^e AMERICAN UNIVERSITY   (United States)

^f IEEE   (India)

^g NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED INSTRUCTION; DATA STRUCTURES; ERROR ANALYSIS; QUALITY ASSURANCE; SOFTWARE ENGINEERING;

CAPABILITY MATURITY MODEL (CMM); DEFECT CAUSAL ANALYSIS;

COMPUTER SOFTWARE SELECTION AND EVALUATION;

EID: 0031676779     PISSN: 07407459     EISSN: None     Source Type: Journal    
DOI: 10.1109/52.646883     Document Type: Article

References (6)

1. R. Mays et al., "Experiences with Defect Prevention," IBM Systems J., Vol. 29, No. 1, 1990, pp. 4-32.
2. O. Dangerfield et al., "Defect Causal-analysis: A Report from the Field," Proc. ASQC 2nd Int'l Conf. Software Quality, ASQC, Milwaukee, Wisc., Oct. 1992.
3. K. Ishikawa, Guide to Quality Control, Asian Productivity Organization, Tokyo, 1976 (revised 1982).
4. R. Chillarge et al., "Orthogonal Defect Classification," IEEE Trans. Software Eng., Nov. 1992, pp. 943-955.
5. M. Paulk et al., "Capability Maturity Model, Version 1.1," IEEE Software, July 1993, pp. 18-27.
6. D. Card, "Defect Causal Analysis Drives Down Error Rates," IEEE Software, July 1993, pp. 98-99.