Novel ultra nanoindentation method with extremely low thermal drift: Principle and experimental results

Journal of Materials Research

Volumn 24, Issue 3, 2009, Pages 873-882

  Nohava, J ^a   Randall, N X ^b   Conte N ^a  

^a CSM Instruments SA   (Switzerland)

^b CSM Instruments Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CREEP TESTING; STABILIZATION;

FRAME COMPLIANCES; HIGH RESOLUTION; LONG-TERM TESTING; LOW-THERMAL DRIFT; NANO-INDENTATION METHODS; STABLE MEASUREMENTS; THERMAL DRIFTS; THERMAL STABILIZATION;

NANOINDENTATION;

EID: 63149110782     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0114     Document Type: Article

References (21)

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