A critical discussion of the current collapse in multifinger HBTs based on floquet stability analysis

INMMIC 2008 - Workshop on Integrated Nonlinear Microwave and Milimetre-Wave Circuits, Proceedings

Volumn , Issue , 2008, Pages 21-24

  Traversa, F L ^a   Cappelluti, F ^a   Bonani, F ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Electrothermal effects; Heterojunction bipolar transistors

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; HETEROJUNCTION BIPOLAR TRANSISTORS; HETEROJUNCTIONS; MICROWAVE CIRCUITS; PREDICTIVE ANALYTICS; STABILIZATION; THERMODYNAMIC STABILITY;

BIFURCATION PHENOMENA; CRITICAL DISCUSSIONS; ELECTRO-THERMAL EFFECTS; FLOQUET MULTIPLIER; FLOQUET STABILITY ANALYSIS; SINGULARITY POINT; STABILITY ANALYSIS; THERMAL INSTABILITIES;

NONLINEAR ANALYSIS;

EID: 62949185914     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/INMMIC.2008.4745704     Document Type: Conference Paper

References (7)

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